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Results 1 to 25 of 175

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Determination of polymer morphology from the intensity measurement in the reciprocal spaceSITU, Guohai; YAN, Li-Tang.European polymer journal. 2010, Vol 46, Num 9, pp 1891-1895, issn 0014-3057, 5 p.Article

Angle calculations for a z-axis/(2S+2D) hybrid diffractometerBUNK, Oliver; NIELSEN, Martin Meedom.Journal of applied crystallography. 2004, Vol 37, pp 216-222, issn 0021-8898, 7 p., 2Article

Probing structure and microstructure of epitaxial Ni-Mn-Ga films by reciprocal space mapping and pole figure measurementsGE, Y; HECZKO, O; HANNULA, S.-P et al.Acta materialia. 2010, Vol 58, Num 20, pp 6665-6671, issn 1359-6454, 7 p.Article

SXD : the single-crystal diffractometer at the ISIS spallation neutron sourceKEEN, David A; GUTMANN, Matthias J; WILSON, Chick C et al.Journal of applied crystallography. 2006, Vol 39, pp 714-722, issn 0021-8898, 9 p., 5Article

Nanoscale resolution of atomic and molecular radiationARNOLDUS, Henk F.Modern topics in chemical physics. 2002, pp 149-162, isbn 81-7736-066-3, 14 p.Book Chapter

Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of informationASPNES, D. E; CHOI, S. G.Thin solid films. 2014, Vol 571, pp 506-508, issn 0040-6090, 3 p., 3Conference Paper

WCEN : a computer program for initial processing of fiber diffraction patternsWEN BIAN; HONG WANG; MCCULLOUGH, Ian et al.Journal of applied crystallography. 2006, Vol 39, pp 752-756, issn 0021-8898, 5 p., 5Article

The misfit dislocation density profile in graded SiGe/Si(001) layers prepared at different temperaturesENDRES, J; DANIS, S; BAUER, G et al.Journal of physics. Condensed matter (Print). 2013, Vol 25, Num 17, issn 0953-8984, 175802.1-175802.7Article

X-ray diffraction analysis of step-graded InxGa1-xAs buffer layers grown by molecular beam epitaxyHAI LIN; YIJIE HUO; YIWEN RONG et al.Journal of crystal growth. 2011, Vol 323, Num 1, pp 17-20, issn 0022-0248, 4 p.Conference Paper

Structural deformation reduction of ZnTe heteroepitaxial layers grown on GaAs (001) substrates by using low-temperature bufferLEE, Woong; JUNG, Myunghoon; JUNG, Mina et al.Journal of crystal growth. 2007, Vol 304, Num 1, pp 22-25, issn 0022-0248, 4 p.Article

Lattice structure of a freestanding nitrogen doped large single crystal diamond plate fabricated using the lift-off process: X-ray diffraction studiesTSUBOUCHI, Nobuteru; UMEZAWA, Hitoshi; MOKUNO, Yoshiaki et al.Diamond and related materials. 2012, Vol 25, pp 119-123, issn 0925-9635, 5 p.Article

Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal spaceHOLY, V; MUNDBOTH, K; MOKUTA, C et al.Thin solid films. 2008, Vol 516, Num 22, pp 8022-8028, issn 0040-6090, 7 p.Conference Paper

Crystal planes and reciprocal space in Clifford geometric algebraHITZER, E.Mathematical methods in the applied sciences. 2011, Vol 34, Num 12, pp 1421-1429, issn 0170-4214, 9 p.Article

Defect structure of zinc doped silicon studied by X-ray diffuse scattering methodSHCHERBACHEV, Kirill D; PRIVEZENTSEV, Vladimir V.Physica. B, Condensed matter. 2009, Vol 404, Num 23-24, pp 4630-4633, issn 0921-4526, 4 p.Conference Paper

Time-of-flight grazing incidence small angle neutron scattering on Gd nanowiresKREUZPAINTNER, W; MOULIN, J.-F; LOTT, D et al.The European physical journal. Special topics. 2009, Vol 167, pp 73-79, issn 1951-6355, 7 p.Conference Paper

Three-dimensional small-angle neutron scattering of shear-induced phase separation in a dynamically asymmetric polymer mixtureKOIZUMI, Satoshi; SUZUKI, Jun-Ichi.Journal of applied crystallography. 2006, Vol 39, pp 878-888, issn 0021-8898, 11 p., 6Article

Epitaxial growth of Nb-doped SrTiO3 films by pulsed laser depositionMARKOVICH, M; ROQUETA, J; SANTISO, J et al.Applied surface science. 2012, Vol 258, Num 23, pp 9496-9500, issn 0169-4332, 5 p.Conference Paper

Reciprocal space mapping of BaZrO3 within (Nd,Eu,Gd)Ba2Cu3Oy films prepared by various film growth techniquesICHINO, Y; YOSHIDA, Y; FUNAKI, S et al.Physica. C. Superconductivity. 2009, Vol 469, Num 15-20, pp 1400-1403, issn 0921-4534, 4 p.Conference Paper

High-Quality Epitaxy of Ruthenium Dioxide, RuO2, on Rutile Titanium Dioxide, TiO2, by Pulsed Chemical Vapor DepositionXINWEI WANG; GORDON, Roy G.Crystal growth & design. 2013, Vol 13, Num 3, pp 1316-1321, issn 1528-7483, 6 p.Article

Direct Imaging of Atomic-Scale Ripples in Few-Layer GrapheneWANG, Wei L; BHANDARI, Sagar; WEI YI et al.Nano letters (Print). 2012, Vol 12, Num 5, pp 2278-2282, issn 1530-6984, 5 p.Article

Polymorphic Perversity : Crystal Structures with Many Symmetry-Independent Molecules in the Unit CellBERNSTEIN, J; DUNITZ, J. D; GAVEZZOTTI, A et al.Crystal growth & design. 2008, Vol 8, Num 6, pp 2011-2018, issn 1528-7483, 8 p.Article

Spin-Enabled Plasmonic Metasurfaces for Manipulating Orbital Angular Momentum of LightGUIXIN LI; MING KANG; SHUMEI CHEN et al.Nano letters (Print). 2013, Vol 13, Num 9, pp 4148-4151, issn 1530-6984, 4 p.Article

Reversible Shape Changes of Pd Nanoparticles on MgO(100)NOLTE, Philipp; STIERLE, Andreas; KASPER, Nikolai et al.Nano letters (Print). 2011, Vol 11, Num 11, pp 4697-4700, issn 1530-6984, 4 p.Article

Three dimensional reconstruction of nanoislands from grazing-incidence small-angle X-ray scatteringYEFANOV, O. M; VARTANYANTS, I. A.The European physical journal. Special topics. 2009, Vol 167, pp 81-86, issn 1951-6355, 6 p.Conference Paper

Reciprocal space analysis of β phase precipitates in a TiAlW alloyZHANG, H; LI, Z. C; HE, L. L et al.Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2005, Vol 403, Num 1-2, pp 120-124, issn 0921-5093, 5 p.Article

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